Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 Architectural activities in the life

Architectural activities in the life cycle

This document is not intended for the purpose of taking a decision whether an incident is reportable or not

Using BS EN 55016-1-3 you can specify the characteristics and calibration of the absorbing clamp

– Event reporting and logging

Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 Architectural activities in the lifeWhat is this standard about? The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military and aerospace related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of