JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working 5080-192750-12: X-AXIS

5080-192750-12: X-AXIS

Part No: 15-148434-00

System Sub-Assembly: Beam Focus Stage

Spindle Shaft/Bearing This Novellus Systems 15-01132-00 Housing Spindle Shaft Bearing is new surplus

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working 5080-192750-12: X-AXISJEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items