JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Buyer is responsible for return

Buyer is responsible for return item shipping costs

Model No: AC9-NCCCCC-00

AMAT Applied Materials Part No: 0190-28862

Part No: AS01491-0-4

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Buyer is responsible for returnJEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item