F06700 - SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity Revision:SEMI F67-1101 (Reapproved 0713) - Current 本スタンダードは，global Physical Interfaces & Carriers

本スタンダードは，global Physical Interfaces & Carriers Committeeで技術的に承認されている。現版は2009年5月13日，global Audits and Reviews Subcommitteeにて発行が承認された。2009年6月にwww

this is beyond the scope of this Standard because the as-received wafers rarely contain oxygen precipitates large enough to impact GOI

This document describes the method to measure the abrasive characteristics of molding compounds by measuring mold orifice weight loss as a function of molded volume

SEMI E77-1104 (technical revision)

F06700 - SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity Revision:SEMI F67-1101 (Reapproved 0713) - Current 本スタンダードは，global Physical Interfaces & CarriersThis Standard was technically approved by the Gases Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on June 4, 2013. Available at www. semiviews. org and www. semi. org in July 2013; originally published November 2001; previously published November 2008. The purpose of this Document is to define a test method to quantify impurity removal capacity of inert gas purifiers. To determine